F-2031-32mm. FCC EM Injection Clamps offer unique benefits.
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Fig. 1: Test Setup/EM Clamp & Ferrite Tube Decoupling Network |
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Specifications for Models: F-2031-23mm & F-2031-32mm |
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Figure 2: Insertion Loss and K Factor |
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Broad bandwidth -- usable from 10 kHz to 1 GHz |
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High efficiency coupling factor, <3 dB from 150 kHz - 500 MHz |
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F-2031-32mm is ideal for testing multi-conductor cables |
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FCC offers all of the test accesories required for testing with the EM Injection Clamps including clamp-on current monitor probes, calibration fixtures and ferrite tube decoupling networks with 23 mm and 32 mm apertures. |
| RF electromagnetic fields frequently degrade electronic equipment by generating common mode currents on cables. The effect of these E and H fields on the equipment can be simulated by injecting common mode currents into the cables of the equipment being tested for RF immunity. IEC 1000-4-6 defines the methods for testing the immunity of electronic equipment to conducted mode currents between 150 kHz and 230 MHz. |
| The electromagnetic (EM) clamp is a high efficiency broadband clamp-on injection device developed to test the immunity of electronic equipment when the standard IEC 1000-4-6 CDN using the direct capacitive coupling technique is not possible nor appropriate. The EM Clamp is often used to test unshielded multiple conductor cables. |
| Figure 1 shows a typical test setup using the EM Clamp and a ferrite tube decoupling network |
| For conducted immunity testing from 150 kHz to 230 MHz the increased efficiency can save the user as much as 100% on required CW amplifier power. The F-203I family requires less than 10 watts to develop the 10 volt open circuit level in accord with the IEC 1000-4-6. When an additional ferrite decoupling or ferrite tube is used in the test the F-203I family requires less than 36 watts to develop the 10 volt open circuit level. |
20603 Earl Street • Torrance, CA 90503 • Tel: (310) 303-3300 • Fax: (310) 371-6268
E-mail: sales@fischercc.com
